(Solved): 3-84. In studying the uniformity of polysilicon thickness on a wafer in semiconductor manufacturin ...

3-84. In studying the uniformity of polysilicon thickness on a wafer in semiconductor manufacturing, Lu, Davis, and Gyurcsik (Journal of the American Statistical Association, Vol. 93, 1998) collected data from 22 independent wafers: 494, 853, 1090, 1058, 517, 882, 732, 1143, 608, 590, 940, $$920,917,581,738,732,750,1205,1194,1221,1209,708$$. Is it reasonable to model these data using a normal probability distribution?